The modular, fully integrated 4200A-SCS parameter analyzer performs electrical characterization of materials, semiconductor devices and processes. The software guides the user in performing complex characterization tests using I-V and C-V measurement sweeps, ultra-fast pulsed & transient I-V and arbitrary waveform to fully characterize their device under test. Now running Windows 10 OS.
• Modular architecture – configurable and scalable to test needs.
• 10 aA and 0.2 μV SMU/PA measure resolution.
• Multi-frequency, Quasistatic and VLF C-V measurement capabilities.
• Two-channel, Ultra-Fast Pulse I-V module for transient and self-.heating analysis.
• Includes software drivers for leading analytical probers.
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