Tektronix Automated Characterization Suite (ACS) Software, ACS Basic, ACS Wafer Level Reliability Option

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Automated Characterization Suite (ACS) software automates semiconductor device characterization at the device, wafer, or cassette level.

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Description

Automated Characterization Suite (ACS) software automates semiconductor device characterization at the device, wafer, or cassette level. Combined with Keithley’s wide range of source-measure instrumentation or S500 Integrated Test Systems, ACS-based solutions fill the gap between interactive lab-based setups and high-speed production test systems.

• ACS is a flexible, interactive software test environment that supports many Keithley instruments and parametric test systems.
• ACS-2600-RTM option with Series 2600B System SourceMeter® instruments provides a wafer level reliability solution.
• ACS Basic Edition is optimized for component and discrete device testing.
• ACS’s hardware support ranges from bench-top instruments used in a QA lab to automated rack-based parametric testers.
• For component and discrete device testing, ACS Basic Edition maximizes research and development productivity.

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